Glenn Langenburg and Eric Ray interview Teresa Wu from IDEMIA about the new product launch of IDEMIA’s Case AFIS. The new system can quickly scan in exemplar prints from any type of standard or non-standard cards which then serve as a mini-database for an AFIS search. Efficiency is vastly improved when the computer takes care of the searching aspect of latent print comparisons. This process can also almost eliminate erroneous exclusions from casework.

This episode is sponsored by IDEMIA.